EQUIVALENCE OF LTSLM AND LTSEM ANALYSES - STUDY OF A YBA2CU3O7 MULTILAYER DEVICE

Low-temperature scanning electron microscopy (LTSEM) and low-temperatu re scanning laser microscopy (LTSLM) are both methods for analyzing lo cal electrical properties of superconducting devices. With both techni ques we have investigated a YBa2Cu3O7, (YBCO) multi-layer device on a SrTiO3, (100) substrate namely a micro-bridge containing a set of cros sovers. We find that critical current density and critical temperature of this device are reduced at the edges of the crossovers, Complete e quivalence of the results obtained for LTSEM and LTSLM has been found, in particular concerning the spatial distribution, the temperature de pendence, and the strength of the signal. (C) 1997 Elsevier Science B. V.