This paper investigates the fracture resistance behavior of a novel si
licon nitride with a unique laminated structure consisting of alternat
e dense and porous layers, in the latter of which beta-silicon nitride
whiskers were aligned parallel to the layer. The R-curve was determin
ed by using a chevron-notched-beam technique when a crack propagated i
n the direction normal to the whisker axis. The resistance markedly in
creased whenever a crack passed the porous layer, resulting in stepwis
e rising R-curve behavior. Microscopic study revealed that the aligned
whiskers were almost completely pulled out in the porous layer.