LATERAL FORCE MICROSCOPY - A QUANTITATIVE APPROACH

The requirements for placing lateral force microscopy (LFM) on a quant itative basis are considered, with a view to enhancing the prospects f or application in nanotribology. Methods for determining the critical parameters of the LFM system are reviewed and discussed (e.g. tip shap e, detector sensitivity, normal and lateral spring constants of the fo rce-sensing/loading lever, effective normal and lateral forces, and in fluence of topography). The emphasis is on exploitation of the capabil ities inherent in the AFM/LFM system so as to obtain the relevant para meters and variables in situ during the conduct of an experiment. (C) 1997 Elsevier Science S.A.