Thin films of poly(di-n-hexylsilane) were irradiated with 2-20 MeV H+,
He+ and He2+ ion beams. The beams caused heterogeneous reactions of c
rosslinking and main chain scission in the films. The relative efficie
ncy of the crosslinking was drastically changed in comparison with tha
t of main chain scission. The anomalous change in the molecular weight
distribution was analyzed with increasing irradiation flux, and the i
on beam induced reaction radius; the track radius was determined for t
he radiation sources by the function of molecular weight dispersion. T
he values obtained ranged from 5.9 +/- 1.5 nm for 2 MeV He+ to 1.0 +/-
0.5 nm for and 20 MeV H+ ion beam irradiation. (C) 1997 Elsevier Scie
nce Ltd. All rights reserved.