C. Leon et al., UNIVERSAL SCALING OF THE CONDUCTIVITY RELAXATION IN CRYSTALLINE IONICCONDUCTORS, Physical review. B, Condensed matter, 57(1), 1998, pp. 41-44
We present complex admittance measurements on single-crystal yttria-st
abilized zirconia and polycrystalline Li0.5La0.5TiO3 over the frequenc
y range 5 Hz to 30 MHz and at temperatures ranging between 150 and 650
K. Electric-field relaxation in both fast ionic conductors can be des
cribed using Kohlrausch-Williams-Watts decay functions, but departures
are observed at high frequencies and low temperatures. Electric modul
us data obey the Dixon-Nagel scaling that has been proposed to be univ
ersal in describing the relaxation processes in supercooled liquids. O
ur data provide broader universality to the Dixon-Nagel scaling, and a
re interpreted in terms of the influence of mobile ions positional dis
order on the relaxation dynamics.