UNIVERSAL SCALING OF THE CONDUCTIVITY RELAXATION IN CRYSTALLINE IONICCONDUCTORS

Citation
C. Leon et al., UNIVERSAL SCALING OF THE CONDUCTIVITY RELAXATION IN CRYSTALLINE IONICCONDUCTORS, Physical review. B, Condensed matter, 57(1), 1998, pp. 41-44
Citations number
25
Categorie Soggetti
Physics, Condensed Matter
ISSN journal
01631829
Volume
57
Issue
1
Year of publication
1998
Pages
41 - 44
Database
ISI
SICI code
0163-1829(1998)57:1<41:USOTCR>2.0.ZU;2-O
Abstract
We present complex admittance measurements on single-crystal yttria-st abilized zirconia and polycrystalline Li0.5La0.5TiO3 over the frequenc y range 5 Hz to 30 MHz and at temperatures ranging between 150 and 650 K. Electric-field relaxation in both fast ionic conductors can be des cribed using Kohlrausch-Williams-Watts decay functions, but departures are observed at high frequencies and low temperatures. Electric modul us data obey the Dixon-Nagel scaling that has been proposed to be univ ersal in describing the relaxation processes in supercooled liquids. O ur data provide broader universality to the Dixon-Nagel scaling, and a re interpreted in terms of the influence of mobile ions positional dis order on the relaxation dynamics.