The change in the short-range order created by ion milling in the near
surface region of InP single crystals was investigated by primary bea
m diffraction modulated electron emission (PDMEE). The very early stag
e of the damage creation by low energy (0.6-1 keV) Ar ions in normal a
nd oblique incidence was studied. A simple model based on the weighted
combination of perfectly crystalline and completely amorphous regions
was used to model the experimental results. Evidence of a subsurface
nucleation of the amorphization process was found. We also found that
the total sputtering yield is markedly dependent on the ion dose, bein
g on the undamaged surface much larger than its steady state value. Lo
w energy electron diffraction (LEED) measurements were also performed
to correlate long-range and short-range order removal by ion bombardme
nt. Finally, the ion damage on the GaAs and InP surfaces was comparati
vely discussed. (C) 1997 Elsevier Science B.V.