R. Gaska et al., THE INFLUENCE OF THE DEFORMATION ON THE 2-DIMENSIONAL ELECTRON-GAS DENSITY IN GAN-ALGAN HETEROSTRUCTURES, Applied physics letters, 72(1), 1998, pp. 64-66
We report on the effect of external strain on the two-dimensional elec
tron gas density in AlGaN/GaN heterostructures grown on sapphire by lo
w pressure metalorganic chemical vapor deposition. The electron sheet
concentration in the studied samples was 4x10(12)-2x10(13) cm(-2) and
decreased with compressive strain. Lower doped heterostructures had a
higher sensitivity to applied strain. The comparison between the exper
imental data and our model shows that the GaN layers are primarily nit
rogen terminated at the heterointerface. (C) 1998 American Institute o
f Physics.