TEMPERATURE-DEPENDENCE OF MOBILITY IN N-TYPE SHORT-PERIOD SI-GE SUPERLATTICES

Citation
Tp. Pearsall et al., TEMPERATURE-DEPENDENCE OF MOBILITY IN N-TYPE SHORT-PERIOD SI-GE SUPERLATTICES, Applied physics letters, 72(1), 1998, pp. 76-78
Citations number
16
Categorie Soggetti
Physics, Applied
Journal title
ISSN journal
00036951
Volume
72
Issue
1
Year of publication
1998
Pages
76 - 78
Database
ISI
SICI code
0003-6951(1998)72:1<76:TOMINS>2.0.ZU;2-F
Abstract
We have studied the mobility and carrier concentration as a function o f temperature between 4 and 300 K in n-type Si-Ge short-period superla ttices. In the parallel transport configuration, we have measured a mo bility ratio mu(77)/mu(300)>50 in an n-type strained-layer superlattic e with a carrier concentration in the mid 10(16) cm(-3) range. The pea k mobility measured was 17 000 cm(2)/V s(-1) at 70 K. Carrier freeze-o ut effects frustrated transport measurements below 60 K. Above 80 K th e mobility is limited by optical phonon scattering with a characterist ic phonon energy of 60 meV. These characteristics indicate electron tr ansport via extended states. (C) 1998 American Institute of Physics.