Compositions of Li-Ge-O electrolyte thin films (0.1 to 3 mu m thick) d
eposited by r.f. sputtering were determined by Rutherford backscatteri
ng spectrometry (RBS) and proton induced gamma-ray emission spectrosco
py (PIGE). The aim of this paper is to illustrate the interest of thes
e techniques in composition determination of thin films. The use of th
ese techniques allows the optimization of Li-Ge-O thin films compositi
on giving the highest ionic conductivity.