ATOMIC-FORCE MICROSCOPY AS A TOOL TO CORRELATE NANOSTRUCTURE TO PROPERTIES OF GLASSES

Atomic force microscopy (AFM) provides high resolution images of surfa ces even if they are non-conducting. Thus, glass can be investigated w ithout conductive preparation or other complicated preparation techniq ues. So far, the great advantage of this microscopy in ambient atmosph ere impeded atomic resolution on vitreous surfaces. However, AFM prove d to be an appropriate tool for imaging the structure on a nanometre s cale, of glasses, glass ceramics and coatings on glass. AFM serves to detect surface defects and changes in the overall surface topology aft er different treatments, such as polishing, cleaning, aging and corrod ing. With the help of suitable preparation, volume properties can also be investigated with a spatial resolution in the nanometre range. AFM contributions to glass research fields like fracture mechanics, cryst allization, interfaces and gel consolidation are reviewed in this pape r. (C) 1997 Elsevier Science B.V.