EXCITON-POLARITON BEHAVIOR OF THE ABSORPTION-EDGE OF THIN GAAS CRYSTALS WITH THE SUPER-QUANTUM THICKNESS AND MQW ENLARGED BARRIERS

Citation
Gn. Aliev et al., EXCITON-POLARITON BEHAVIOR OF THE ABSORPTION-EDGE OF THIN GAAS CRYSTALS WITH THE SUPER-QUANTUM THICKNESS AND MQW ENLARGED BARRIERS, Physica status solidi. a, Applied research, 164(1), 1997, pp. 193-197
Citations number
7
ISSN journal
00318965
Volume
164
Issue
1
Year of publication
1997
Pages
193 - 197
Database
ISI
SICI code
0031-8965(1997)164:1<193:EBOTAO>2.0.ZU;2-U
Abstract
At T = 1.7 K the optical absorption of pure GaAs samples with thicknes s d = 0.4 to 4.4 mu m has been investigated in the region of the excit on-polariton resonances. The dependence of the integral absorption on the thickness is considered as a result of the competition of the opti cal processes in two different sample regions: near-surface region, wh ere the integral absorption saturates due to increasing damping parame ter in the electric field and central region, where the exciton-polari ton is not perturbed. We have observed a series of narrow lines near t he ground GaAs exciton state in the part of MQW spectra which belongs to the enlarged barrier. Calculations by the transfer matrix method gi ve a good agreement with the model taking into account the quantizatio n of the exciton as a whole and exciton-polariton wave interference.