We have integrated an STM unit with a conventional scanning electron m
icroscope in order to perform STM-SEM correlative microscopy. The meth
od is applied to an electrochemically facetted gold sample, which prov
ides a surface structure suitable for this study. We discuss the facto
rs which are relevant in order to obtain a quantitative resolution of
the topographic surface structure, by taking advantage of the performa
nces of both techniques. In particular we suggest the use of the STM h
eight distribution as the best parameter for STM/SEM correlation. Fina
lly, from the STM data we deduce that the main process during electroc
hemical etching is the formation of (111) faces.