In this paper we demonstrate that photoluminescence (PL) from GaAs exp
osed to (3-mercaptopropyl)trimethoxysilane (MPT) exhibits a 10-fold en
hancement over that of an oxidized sample. The PL enhancement is attri
buted to the formation of sulfur-surface bonds. We demonstrate that th
e MPT surface film that results from the treatment described herein is
a monolayer thick by ellipsometry, and we examine the composition of
the GaAs/MPT interfacial region using X-ray photoelectron spectroscopy
(XPS). The XPS results indicate that the native oxide is removed by t
he etching procedure, and reoxidation of the surface is minimal during
the subsequent deposition of MPT. The nature of the sulfur-surface bo
nd is discussed in view of the XPS results reported here and those of
previous measurements by other researchers. The self-assembled monolay
ers of MPT that forms on the GaAs surface leave a trimethoxy-silyl ter
minated surface that can be polymerized by exposure to weak acid. We d
emonstrate that the polymerized overlayer inhibits reoxidation of the
GaAs surface better than the nonpolymerized, MPT treated surface.