Two structural descriptors were chosen as possible model descriptors f
or predicting subcooled-liquid vapor pressures of polychlorinated biph
enyls (PCBs), chlorophenols (CPs), chlorobenzenes (CBs) and alkylpheno
ls and predictive power of the two descriptors are discussed. The Char
acteristic Root Index (CRT) and third order cluster-type molecular con
nectivity index ((3) chi(c)) were calculated exclusively on the basis
of information readily available for all chemicals. To apply the regre
ssion model to a wide range of chemicals multiple linear regression ha
s been tried, however, collinearity was observed between the two struc
tural descriptors. Subcooled-liqiud vapor pressures obtained by using
the best correlative equation with the CRI for 54 PCB congeners, all c
hlorophenols and chlorobenzenes and several alkylphenols have been rep
orted. (C) 1997 Elsevier Science Ltd.