Carbon diffusion into silicon is well behaved and does not generate an
y nonequilibrium point defects. We show that, in contrast, the diffusi
on of carbon incorporated in silicon well above its solid solubility w
ill cause an undersaturation of silicon self-interstitials, which in t
urn may cause retarded diffusion of boron. In addition, we predict tha
t due to this undersaturation, the diffusion of built-in carbon spikes
will lead to strongly non-Gaussian concentration profiles. (C) 1998 A
merican Institute of Physics.