CARBON-INDUCED UNDERSATURATION OF SILICON SELF-INTERSTITIALS

Citation
R. Scholz et al., CARBON-INDUCED UNDERSATURATION OF SILICON SELF-INTERSTITIALS, Applied physics letters, 72(2), 1998, pp. 200-202
Citations number
14
Categorie Soggetti
Physics, Applied
Journal title
ISSN journal
00036951
Volume
72
Issue
2
Year of publication
1998
Pages
200 - 202
Database
ISI
SICI code
0003-6951(1998)72:2<200:CUOSS>2.0.ZU;2-S
Abstract
Carbon diffusion into silicon is well behaved and does not generate an y nonequilibrium point defects. We show that, in contrast, the diffusi on of carbon incorporated in silicon well above its solid solubility w ill cause an undersaturation of silicon self-interstitials, which in t urn may cause retarded diffusion of boron. In addition, we predict tha t due to this undersaturation, the diffusion of built-in carbon spikes will lead to strongly non-Gaussian concentration profiles. (C) 1998 A merican Institute of Physics.