REVERSIBLE AND IRREVERSIBLE EFFECTS ON THE ELECTRICAL CHARACTERISTICSOF NEW HIGH-SPEED A-SI AND A-SIC SWITCHES

Citation
Ei. Dimitriadis et al., REVERSIBLE AND IRREVERSIBLE EFFECTS ON THE ELECTRICAL CHARACTERISTICSOF NEW HIGH-SPEED A-SI AND A-SIC SWITCHES, Microelectronics, 29(1-2), 1998, pp. 5-11
Citations number
8
Categorie Soggetti
Engineering, Eletrical & Electronic
Journal title
ISSN journal
00262692
Volume
29
Issue
1-2
Year of publication
1998
Pages
5 - 11
Database
ISI
SICI code
0026-2692(1998)29:1-2<5:RAIEOT>2.0.ZU;2-S
Abstract
The reversible effect of various factors, such as temperature, light i ntensity and potential applied to a gate electrode, on the electrical characteristics of new high-speed a-Si/c-Si- and a-SiC/c-Si-based swit ches are, for the first time, presented and discussed in this paper. T he irreversible effect of the width of amorphous film on the electrica l characteristics of these switches is also studied. The values of for ward breakover voltage (V-BF), forward voltage drop (V-F) and holding current (I-h) of these thyristor-like switches may be either reversibl y or irreversibly controlled by varying the above factors, thus contro lling the device operation. (C) 1997 Published by Elsevier Science Ltd .