XAFS AND X-RAY REFLECTIVITY STUDIES OF BURIED INTERFACES

Many of the properties of materials are not due to single-crystal prop erties, but rather the structure and behavior of internal interfaces. Unlike a free surface, however, there are few ways to nondestructively probe these ''buried'' interfaces. Here, results are presented on sev eral systems, including semiconductor heterointerfaces exhibiting comp lex reconstruction, and internal interfaces in metals and semiconducto rs showing anisotropic atomic motion, In discussing these results, it is shown how X-ray Absorption Fine-structure Spectroscopy (XAFS), X-ra y diffraction, and X-ray reflectivity measurements complement one anot her. (C) 1997 Published by Elsevier Science B.V.