G. Ouvrard et Zy. Wu, XAFS STUDY OF CHARGE-TRANSFER IN INTERCALATION COMPOUNDS, Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms, 133(1-4), 1997, pp. 120-126
Citations number
24
Categorie Soggetti
Instument & Instrumentation","Nuclear Sciences & Tecnology","Physics, Atomic, Molecular & Chemical
An intercalation process is a reversible topotactic reaction in which
a guest species occupies empty sites in a solid structure. A charge tr
ansfer is always observed between the guest and the host. An accurate
knowledge of this electronic exchange, i.e. how many electrons are tra
nsferred and on which electronic level, can only be obtained from prec
ise electronic band structure calculations. Such calculations have to
be supported by experimental data. For this purpose we have compared X
-ray absorption spectroscopy (XAS) data with edge simulations in the m
ultiple scattering formalism and band structure calculations in using
the Tight Binding Linear Muffin Tin Orbitals method in the Atomic Sphe
res Approximation (TB-LMTO-ASA) method. This approach is first illustr
ated by a study of sulfur K edge on the two modifications (1T and 2H)
of tantalum disulfide TaS2. It is then applied for an accurate charact
erization of the charge transfer in the case of lithium intercalation
into TiS2, from XAFS experiments at the sulfur K edge. It is concluded
that sulfur atoms are largely taking part in the intercalation proces
s. (C) 1997 Elsevier Science B.V.