INVESTIGATION OF SNO2 FILMS SURFACE BY RE FLECTION HIGH-ENERGY ELECTRON-DIFFRACTION AND ATOMIC-FORCE MICROSCOPY

Authors
Citation
Al. Tolstikhina, INVESTIGATION OF SNO2 FILMS SURFACE BY RE FLECTION HIGH-ENERGY ELECTRON-DIFFRACTION AND ATOMIC-FORCE MICROSCOPY, Izvestia Akademii nauk SSSR. Seria fiziceskaa, 61(10), 1997, pp. 1925-1930
Citations number
19
Categorie Soggetti
Physics
ISSN journal
03676765
Volume
61
Issue
10
Year of publication
1997
Pages
1925 - 1930
Database
ISI
SICI code
0367-6765(1997)61:10<1925:IOSFSB>2.0.ZU;2-O