Data are presented showing the profile of tin diffusion during the pro
duction of float glass, by measuring non-destructively the refractive
index profiles in the diffused layer. The optical waveguide modes give
unequivocal evidence for an anomaly in the tin depth distribution. Th
e results are compared with those from sectioning techniques, used in
depth profiles determined by ion beam analyses and cathodoluminescence
(CL). There is agreement between these methods which confirm the pres
ence of a maximum in the tin concentration below the surface which had
been in contact with the tin bath (this had been linked by Mossbauer
data to a rise in the Sn4+ concentration). The ion beam analyses recor
d different depth profiles for Si, Na and Ca. The Sn4+ feature increas
es the refractive index, as does the diffusion of Sn2+. The index beco
mes constant at large tin concentrations. We suggest that Sn4+ is link
ed to CL emission at 2.68 eV and Sn2+ to the 1.97 eV CL emission. Iron
impurities give a 1.73 eV signal. Contrary to earlier suggestions, we
prc,pose that the luminescence associated with the presence of tin ar
ises from intrinsic defects stabilised by the tin, not from tin acting
directly as a luminescence site. (C) 1998 Elsevier Science B.V.