Ys. Weng et Ja. Nickoloff, EVIDENCE FOR INDEPENDENT MISMATCH REPAIR PROCESSING ON OPPOSITE SIDESOF A DOUBLE-STRAND BREAK IN SACCHAROMYCES-CEREVISIAE, Genetics, 148(1), 1998, pp. 59-70
Double-strand break (DSB) induced gene conversion in Saccharomyces cer
evisiae during meiosis and MAT switching is mediated primarily by mism
atch repair of heteroduplex, DNA (hDNA). We used nontandem ura3 duplic
ations containing palindromic frameshift insertion mutations near an H
O nuclease recognition site to test whether mismatch repair also media
tes DSB-induced mitotic gene conversion at a non-MAT locus. Palindromi
c insertions included in hDNA are expected to produce a stem-loop mism
atch, escape reto produce a sectored (Ura(+/-)) colony. If conversion
occurs by gap repair, the insertion should be remobed on both strands,
and converted colonies will not be secotred. For both a 14-bp a 14-bp
palindrome, and a 37-bp near-palindrome, similar to 75% of recombinan
t colonies were sectored, indicating that most DSB-induced mitotic gen
e conversion involves mismatch repair of hDNA. We also investigated mi
smatch repair of well-repaired markers flanking an unrepaired palindro
me. As seen in previous studies, these additional markers increased lo
op repair (likely reflecting corepair). Among sectored products, few h
ad additional segregating markers, indicating that the lack of repair
at one marker is not associated with inefficient repair at nearby mark
ers. Clear evidence was obtained for low levels of short tract mismatc
h repair. As seen with full gene conversions, donor alleles in sectore
d products were not altered. Markers on the same side of the DSB as th
e palindrome were involved in hDNA less often among sectored products
than non-sectored products, but markers on the opposite side of the DB
showed similar hDNA involvement among both product classes. These res
ults can be explained in terms of corepair, and they suggest that mism
atch repair on opposite sides of a DSB involves distinct repair tracts
.