CHARACTERIZATION OF QUATERNARY METAL-OXIDE FILMS BY SYNCHROTRON X-RAY-FLUORESCENCE MICROPROBE

Citation
Dl. Perry et al., CHARACTERIZATION OF QUATERNARY METAL-OXIDE FILMS BY SYNCHROTRON X-RAY-FLUORESCENCE MICROPROBE, Applied spectroscopy, 51(12), 1997, pp. 1781-1783
Citations number
20
Journal title
ISSN journal
00037028
Volume
51
Issue
12
Year of publication
1997
Pages
1781 - 1783
Database
ISI
SICI code
0003-7028(1997)51:12<1781:COQMFB>2.0.ZU;2-C
Abstract
A synchrotron X-ray fluorescence microprobe has been used to study the composition and microstructure of pulsed-laser ablation-deposited fil ms of calcium-nickel-potassium oxides that have applications in hetero geneous catalysis. The films, whose individual metal oxide components have widely varying boiling points and thus prevent a solid-phase synt hesis with the use of standard thermal techniques, represent a new qua ternary metal oxide phase containing the three elements. Experimental conditions for preparing the films are given. The X-ray fluorescence m icroprobe data are discussed with respect to both the distribution of the three metals in the films at the micrometer lateral spatial resolu tion level and the presence of trace amounts of metals that were intro duced into the films as contaminants in targets made of the parent thr ee-metal oxide.