Dl. Perry et al., CHARACTERIZATION OF QUATERNARY METAL-OXIDE FILMS BY SYNCHROTRON X-RAY-FLUORESCENCE MICROPROBE, Applied spectroscopy, 51(12), 1997, pp. 1781-1783
A synchrotron X-ray fluorescence microprobe has been used to study the
composition and microstructure of pulsed-laser ablation-deposited fil
ms of calcium-nickel-potassium oxides that have applications in hetero
geneous catalysis. The films, whose individual metal oxide components
have widely varying boiling points and thus prevent a solid-phase synt
hesis with the use of standard thermal techniques, represent a new qua
ternary metal oxide phase containing the three elements. Experimental
conditions for preparing the films are given. The X-ray fluorescence m
icroprobe data are discussed with respect to both the distribution of
the three metals in the films at the micrometer lateral spatial resolu
tion level and the presence of trace amounts of metals that were intro
duced into the films as contaminants in targets made of the parent thr
ee-metal oxide.