Is. Tashlykov, A MODEL OF OXIDE LAYER GROWTH ON AG-IMPLANTED NICKEL ANODE IN AQUEOUSALKALINE-SOLUTION( AND PT+ ION), Thin solid films, 307(1-2), 1997, pp. 106-109
This work investigates nickel oxide films growth on nickel implanted w
ith ions of the noble metals Ag and Pt. Polycrystalline and single cry
stal samples of Ni were implanted with high fluences (1 X 10(19)-1 X 1
0(21) m(-2)) of 9-50 keV ions. Galvanostatic and potentiostatic polari
zation techniques were applied to monitor the electrochemical efficien
cies of formation of NixO1-x films in aqueous KOH solution (30%) at 35
3 K. The growth rates, thickness and compositional profiles of oxidise
d nickel layers were examined by means of RBS. It was found that the a
nodic oxide film consists of Ni(OH)(2)XH2O (X greater than or equal to
1). Anodic oxidation of nickel occurs due to out-diffusion of Ni atom
s through the hydroxide layer. Implanted Ag penetrates partly into the
anodic oxide whereas platinum is completely buried beneath the oxide
film. (C) 1997 Elsevier Science S.A.