ULTRATHIN LAYERS OF RARE-EARTH-OXIDES FROM LANGMUIR-BLODGETT-FILMS

Citation
M. Schurr et al., ULTRATHIN LAYERS OF RARE-EARTH-OXIDES FROM LANGMUIR-BLODGETT-FILMS, Thin solid films, 307(1-2), 1997, pp. 260-265
Citations number
14
Journal title
ISSN journal
00406090
Volume
307
Issue
1-2
Year of publication
1997
Pages
260 - 265
Database
ISI
SICI code
0040-6090(1997)307:1-2<260:ULORFL>2.0.ZU;2-L
Abstract
Ultrathin rare earth oxide films have been fabricated using Langmuir-B lodgett films of rare earth arachidates as precursors. Irradiation of these films with UV light and subsequent heating of the films (350 deg rees C) result in oxide films exhibiting a smoothness comparable to th at of the Si-wafers used as substrates (roughness R approximate to 0.3 MI). The film thickness can easily be adjusted via the number of Lang muir-Blodgett monolayers deposited onto the substrate. (C) 1997 Publis hed by Elsevier Science S.A.