EXCITON CONCENTRATIONS IN THIN-FILMS

Citation
Bs. Tosic et al., EXCITON CONCENTRATIONS IN THIN-FILMS, Journal of physics and chemistry of solids, 58(12), 1997, pp. 1995-1999
Citations number
16
ISSN journal
00223697
Volume
58
Issue
12
Year of publication
1997
Pages
1995 - 1999
Database
ISI
SICI code
0022-3697(1997)58:12<1995:ECIT>2.0.ZU;2-F
Abstract
Excitons in thin films are analyzed using Green's function method with in the framework of Tyablikov's version of random phase approximation. The spectra of surface and bulk excitons were determined and the dist ribution of exciton concentrations over film layers was evaluated. It was shown that high surface concentrations could be achieved by decrea sing of the dipole-dipole interaction of the molecules in surface laye rs. (C) 1997 Published by Elsevier Science Ltd. All rights reserved.