X-RAY SPECTROSCOPY AND IMAGING OF NIKE LASER-PRODUCED PLASMAS

Citation
Jf. Seely et al., X-RAY SPECTROSCOPY AND IMAGING OF NIKE LASER-PRODUCED PLASMAS, Journal of quantitative spectroscopy & radiative transfer, 58(4-6), 1997, pp. 905-910
Citations number
9
ISSN journal
00224073
Volume
58
Issue
4-6
Year of publication
1997
Pages
905 - 910
Database
ISI
SICI code
0022-4073(1997)58:4-6<905:XSAION>2.0.ZU;2-F
Abstract
Plastic foils were irradiated by the NRL Nike KrF laser and were image d in the x-ray and extreme ultraviolet regions with 2D spatial resolut ion in the 3-10 mu m range. The CH foils were backlit by a silicon pla sma. The silicon backlighter emission was recorded by an x-ray spectro meter, and the Si+12 1,855 eV resonance line emission was recorded by a fast x-ray diode. A spherically curved quartz crystal produced monoc hromatic images of the 1,865 eV radiation that was transmitted by the CH foils. Instabilities that were seeded by linear ripple patterns on the irradiated sides of CH foils were observed. The ripple patterns ha d periods in the 31-125 mu m range and amplitudes in the 0.25-5.0 mu m range. (C) 1997 Published by Elsevier Science Ltd. All rights reserve d.