D. Muigg et al., KINETIC ENERGIES OF TER-THAN-OR-EQUAL-TO-N-GREATER-THAN-OR-EQUAL-TO-4) PRODUCED BY ELECTRON-IMPACT ON C-60() FRAGMENT IONS (58), The Journal of chemical physics, 108(3), 1998, pp. 963-970
We used mass spectrometric techniques in conjunction with the ion defl
ection method to determine the kinetic energies of C-n(+) fragment ion
s (58 greater than or equal to n greater than or equal to 4) produced
by controlled electron impact on C-60 under single collision condition
s. The recorded ion beam profiles for the various fragment ions were a
nalyzed using two independent methods. One method extracts the average
kinetic energy of the fragment ion under study from the measured half
-width of the ion beam profile (half-width method), whereas the second
method analyzes the entire measured beam profile (profile method). Fo
r each C-n(+) fragment ion, the kinetic energies obtained were interpr
eted assuming two possible formation pathways, (i) the fission of the
excited parent C-60(+) ion in a single-step, two-fragment break-up, C-
60(+)-->C-n(+) + C60-n and (ii) the sequential decay of excited C-60() into C-n(+) via the successive removal of C-m units (m = 1, 2, or 3)
. Both the half-width method and the profile method yield very similar
results for the kinetic energies of the C-n(+) fragment ions for both
formation mechanisms, viz., an average kinetic energy of roughly 0.45
eV in the case of the single-step fission and a linearly increasing a
verage kinetic energy from 0.43 eV for the formation of C-58(+) to rou
ghly 12 eV for the formation of C-4(+) in case of the sequential decay
mechanism (in this case an essentially constant energy of also about
0.45 eV was obtained for the last fragmentation step in each case, whi
ch was confirmed by a third method using a fitting procedure). These r
esults will be discussed in the context of the most likely fragmentati
on mechanism leading to the formation of the various fragment ions. (C
) 1998 American Institute of Physics. [S0021-9606(98)00403-6].