This paper proposes a method of calibrating the dials of the azimuthal
scales of an ellipsometer by scanning the positions of an analyzer cl
ose to the plane of incidence and perpendicular to it. In this case, t
he dependences of the positions of the polarizer and compensator for t
he minimum reflected light are straight lines for any angles of incide
nce of light on the sample. These lines intersect close to the desired
values. (C) 1997 The Optical Society of America. [S1070-9762(97)01812
-5].