Ferroelectric hysteresis of a Bi2SrTa2O9 single crystal, a promising c
andidate for ferroelectric random access memories (FeRAM), was observe
d at 200 degrees C. This single crystal, grown by the self-flux method
, has a composition characterized as BixSryTa2O9 (x = 1.91 +/- 0.05, y
= 1.27 +/- 0.08). Observing the optical anisotropy of the c-plane, it
was found that this material has a Curie temperature (T-c) higher tha
n 250 degrees C. Measuring the electrical properties on the c-axis and
in the c-plane, it was confirmed that this material has electrical an
isotropy. Furthermore; the domain motion of the crystal was observed u
nder an electric field using a high-resolution charge-coupled-device (
CCD) microscope system.