A NEW METHOD TO ANALYZE DENSITY FLUCTUATION BY MICROWAVE REFLECTOMETRY

The runaway phase phenomenon is a problem in reflectometry measurement s. The change in the phase difference between the reflected wave and t he reference one cannot be explained by the movement of the cut-off la yer when the runaway phase phenomenon occurs. It is difficult to extra ct information of the density fluctuation from the data with the runaw ay phase. We show a model in which the runaway phase phenomenon comes from the wave scattered by the density fluctuations, and describe a ne w analysis method based on this model. The obtained results on plasma displacement and density fluctuation spectrum are presented.