Temperature dependent measurements of the noise parameters of a pseudo
morphic high electron mobility transistor show the minimum noise figur
e vanishes at low temperatures for frequencies from 2 GHz up to 18 GHz
and for most currents. We propose that the exponential decrease seen
in the noise figure with temperature is due to a reduction of thermall
y activated noise sources with an activation energy of similar to 95 m
eV. Other noise-parameter data suggest a flattening of the noise figur
e paraboloid as temperature is decreased. These results demonstrate th
e feasibility of designing a near 0.1 dB noise figure amplifier for hi
gh-frequency operation over a wide range of currents. (C) 1998 America
n Institute of Physics.