R. Desmicht et al., POINT-CONTACT ELECTRODES TO PROBE CHARGING EFFECTS IN INDIVIDUAL ULTRASMALL COBALT CLUSTERS, Applied physics letters, 72(3), 1998, pp. 386-388
A new technique to probe a single nanometer-scale magnetic particle by
measuring the tunneling current through point-contact electrodes is d
escribed. The tunnel junctions are formed by a bulk cobalt bottom elec
trode, a monolayer of ultrasmall Co clusters sandwiched between two Al
2O3 barriers and a point-contact top electrode, defined by e-beam lith
ography and permitting to study the quantum transport through an isola
ted cluster. We report on single electron charging effects such as Cou
lomb blockade and Coulomb staircase which are undoubtedly consistent w
ith the tunneling through a single Co cluster. One of our devices exhi
bits a Coulomb gap of 380 mV which is, to our knowledge, one of the la
rgest values ever reported in metallic granular systems. (C) 1998 Amer
ican Institute of Physics.