CHARACTERIZATION AND MODELING OF STEP RECOVERY DIODES

Authors
ZHANG JA RAISANEN AV
Citation
Ja. Zhang et Av. Raisanen, CHARACTERIZATION AND MODELING OF STEP RECOVERY DIODES, Microwave and optical technology letters, 17(3), 1998, pp. 200-205
Citations number
10
Categorie Soggetti
Optics,"Engineering, Eletrical & Electronic
Journal title
Microwave and optical technology letters → ACNP
ISSN journal
08952477
Volume
17
Issue
3
Year of publication
1998
Pages
200 - 205
Database
ISI
SICI code
0895-2477(1998)17:3<200:CAMOSR>2.0.ZU;2-S
Abstract
This paper presents a fast and accurate technique for characterization of the step recovery diode (SRD) from 45 MHz to 18 GHz with a network analyzer. A flexible test fixture is designed for measuring SRD chips . The voltage dependence of the capacitance and the series resistance are extracted om the measured S-parameters. Based on the measured resu lts, a more accurate model of the step recovery diode has been develop ed. This model can be easily implemented in a circuit simulator. (C) 1 998 John Wiley & Sons, Inc.