SENSITIVITY ANALYSIS OF TRANSIENT MEASUREMENTS USING THE MICROWAVE CAVITY PERTURBATION TECHNIQUE

The application of microwave cavity perturbation technique for the stu dy of transients in semiconductors is becoming popular due to its simp licity in measurement procedure and high sensitivity. This paper discu sses the effects of quality factor, sample size, and coupling factor o n the sensitivity of the measurement. Also, it deals with a measuremen t approach for the study of triplet state transitions and excited stat e studies in organic solvents. Finally, a comparison between the cavit y perturbation technique and the currently used reflection technique i s made. (C) 1998 American Institute of Physics. [S0021-8979(98)00702-6 ].