Carrier escape from InP/AlGaAs single quantum well structures is studi
ed by means of simultaneous steady state photocurrent and photolumines
cence measurements. The activation energy for escape is measured for t
he first time in this system. The photoluminescence from the InGaAs we
lls indicates that a significant number of carriers do not escape at r
oom temperature thus affecting the temperature dependence of the cell.
An estimate of the nonradiative efficiency of the device studied is g
iven as a function of bias and temperature. The relevance to new appli
cations is discussed. (C) 1998 American Institute of Physics. [S0021-8
979(98)05801-0].