GRAIN-BOUNDARY-LIMITED TRANSPORT IN SEMICONDUCTING SNO2 THIN-FILMS - MODEL AND EXPERIMENTS

Citation
Mwj. Prins et al., GRAIN-BOUNDARY-LIMITED TRANSPORT IN SEMICONDUCTING SNO2 THIN-FILMS - MODEL AND EXPERIMENTS, Journal of applied physics, 83(2), 1998, pp. 888-893
Citations number
17
Categorie Soggetti
Physics, Applied
Journal title
ISSN journal
00218979
Volume
83
Issue
2
Year of publication
1998
Pages
888 - 893
Database
ISI
SICI code
0021-8979(1998)83:2<888:GTISST>2.0.ZU;2-S
Abstract
We present a model that describes grain-boundary-limited conduction in polycrystalline semiconductors, for thermally assisted ballistic as w ell as diffusive transport, both for degenerate and nondegenerate dopi ng. In addition to bulk parameters (the carrier effective mass and mea n free path) the model contains grain boundary parameters (barrier hei ght and width) and a coefficient of current nonuniformity. Temperature -dependent conductivity and Hall measurements on polycrystalline SnO2 thin films with different Sb concentrations are consistently interpret ed. (C) 1998 American Institute of Physics. [S0021-8979(98)01302-4].