FLUORINATION ASSISTED SLURRY ELECTROTHERMAL VAPORIZATION IN ICP-AES FOR THE DIRECT ANALYSIS OF SILICON DIOXIDE POWDER

Authors
PENG TY JIANG ZC
Citation
Ty. Peng et Zc. Jiang, FLUORINATION ASSISTED SLURRY ELECTROTHERMAL VAPORIZATION IN ICP-AES FOR THE DIRECT ANALYSIS OF SILICON DIOXIDE POWDER, Fresenius' journal of analytical chemistry, 360(1), 1998, pp. 43-46
Citations number
12
Categorie Soggetti
Chemistry Analytical
Journal title
Fresenius' journal of analytical chemistry → ACNP
ISSN journal
09370633
Volume
360
Issue
1
Year of publication
1998
Pages
43 - 46
Database
ISI
SICI code
0937-0633(1998)360:1<43:FASEVI>2.0.ZU;2-V
Abstract
A slurry fluorination electrothermal vaporization (ETV)-ICP-AES method for the determination of Cu and Cr in SiO2 powders has been developed , A polytetrafluoroethylene (PTFE) emulsion is used as fluorinating re agent; the matrix (Si) is partially separated from the sample by selec ting the ashing temperature and time to reduce the interference. Moreo ver, the vaporization behaviour has been investigated in detail. The d etection limits are 1.1 ng/mL with 3.8% of RSD (Cu) and 1.6 ng/mL with 3.2% of RSD (Cr). The method is applied to analyze the SiO2 powders w ith satisfactory results.