Boron nitride films are synthesized by rf magnetron sputtering baron t
argets where the deposition parameters of gas pressure, flow and compo
sition are varied along with substrate temperature and applied bias. T
he films are analyzed using Anger electron spectroscopy, transmission
electron microscopy, nanoindentation, Raman spectroscopy and X-ray abs
orption spectroscopy. These techniques provide characterization of fil
m composition, crystalline structure, hardness and chemical bending, r
espectively. Reactive, rf-sputtering process parameters are establishe
d which lead to the growth of crystalline boron nitride (BN) phases. T
he deposition of stable and adherent baron nitride coatings consisting
of the cubic phase requires 400 degrees C substrate heating and the a
pplication of a 300-V negative bias. Published by Elsevier Science S.A
.