E. Stoffels et al., ELECTRON-ATTACHMENT MASS-SPECTROSCOPY AS A DIAGNOSTICS FOR ELECTRONEGATIVE GASES AND PLASMAS, Review of scientific instruments, 69(1), 1998, pp. 116-122
Electron attachment mass spectrometry (EAMS) has been developed to stu
dy mixtures of electronegative,eases and plasmas. A quadrupole mass sp
ectrometer (QMS) has been used to detect negative ions, formed from sa
mpled species by attachment of low energy electrons. Varying the elect
ron energy allows to collect the attachment cross section of the consi
dered species. EAMS appears to be a very powerful technique to study t
he chemistry of electronegative,eases. Unlike ionization mass spectrom
etry, where cross sections are low at the threshold and rather flat ov
er a broad range of electron energies, attachment resonances are sharp
and distinct. Also very limited fragmentation of the parent negative
ion occurs, so a given molecule yields only a few different negative i
ons. This facilitates identification of components in a gas mixture. I
t is particularly advantageous for detection of large, fragile molecul
es, which break up after ionization, but can be easily transformed int
o large negative ions. Moreover, sensitive detection of active species
is possible due to their relatively high attachment cross sections. A
particularly important application of EAMS is the determination of an
effective attachment cross section in a plasma. Recording this cross
section allows to decide on the actual negative ion formation mechanis
m in the plasma environment, where active products of plasma conversio
n can significantly alter the negative ion production channels and con
sequently the whole balance of charged particles. Examples of EAMS app
lications to fluorocarbon gases and low-pressure radio-frequency plasm
as are discussed. In a CF4 discharge conversion of the parent gas into
species like C2F6 and C3F8 is easily visualized. The dominant mechani
sm of negative ion formation in the plasma is electron attachment to t
hese minority species and not to the parent gas. Also larger polymers
are readily formed in fluorocarbon plasmas. In a C2F6 discharge molecu
les with up to ten carbon atoms (the mass limit of our apparatus) have
been detected using EAMS. (C) 1998 American Institute of Physics.