W. Ozaki et Sr. Buchman, USE OF SCANNING ELECTRON-MICROSCOPY IN THE EVALUATION OF CRANIOSYNOSTOSIS, The Journal of craniofacial surgery, 9(1), 1998, pp. 30-38
The cause of craniosynostosis continues to elude researchers. Although
several studies have leaked at the ultrastructure of normal suture cl
osure, no previous studies have examined the microarchitecture of the
synostotic suture. Our goal was to assess the scanning electron micros
cope (SEM) as a viable and useful tool in examining craniosynostosis.
Our hypothesis is that the SEM is a powerful analytical tool that can
evaluate nonsynostotic, partial synostotic, and complete synostotic cr
anial sutures. We analyzed the cranial suture of 3 human infants with
nonsyndromic sagittal cranio synostosis. The specimens were separated
into three groups, which included regions of partial and complete syno
stosis and a region oi: open suture. Histological examination provided
cellular and tissue data about craniosynostosis, whereas the SEM prov
ided detailed information regarding the trabecular microarchitecture o
f the synostosed suture. The SEM produced quality images of complete a
nd partially synostotic sutures and open sutures, At low magnification
, the SEM characterized the general bony microarchitecture of cranial
sutures in a manner different from, but complementary to, standard his
tological, sections. At higher magnification, the SEM allowed us a loo
k at the cellular population of craniosynostotic sutures in a way that
surpasses standard light microscopy. The SEM is an excellent tool for
the study of craniosynostosis and has proved invaluable in our abilit
y to evaluate the microarchitecture and cellular population of the fus
ing suture, We believe we have proven our hypothesis by demonstrating
the SEM to be a powerful analytical tool that can evaluate nonsynostot
ic, partial synostotic, and complete synostotic cranial sutures.