ON-WAFER CALIBRATION OF A DOUBLE 6-PORT REFLECTOMETER INCLUDING CONSTANTS FOR ABSOLUTE POWER MEASUREMENTS

Authors
BERGHOFF G BERGEAULT E HUYART B JALLET L
Citation
G. Berghoff et al., ON-WAFER CALIBRATION OF A DOUBLE 6-PORT REFLECTOMETER INCLUDING CONSTANTS FOR ABSOLUTE POWER MEASUREMENTS, IEEE transactions on instrumentation and measurement, 46(5), 1997, pp. 1111-1114
Citations number
9
Categorie Soggetti
Engineering, Eletrical & Electronic","Instument & Instrumentation
Journal title
IEEE transactions on instrumentation and measurement → ACNP
ISSN journal
00189456
Volume
46
Issue
5
Year of publication
1997
Pages
1111 - 1114
Database
ISI
SICI code
0018-9456(1997)46:5<1111:OCOAD6>2.0.ZU;2-V
Abstract
The complete calibration of a double six-port network analyzer include s constants for the measurement of wave ratios (S-parameters) as well as constants for absolute power level measurements for nonlinear devic e characterization. This paper describes how a complete set of constan ts can be obtained for on-wafer measurements from a complete calibrati on in a coaxial measurement plane and a subsequent on-wafer calibratio n with the minimum number of elements.