STUDY ON THE STRUCTURAL CHARACTERISTICS OF GRAPHITIZED CARBON MICROCRYSTAL PREPARED FROM PI FILM USING X-RAY-DIFFRACTION TECHNIQUE

The structural characteristics of the graphitized carbon microcrystal prepared from carbonized polyimide (PI) film were explored using X-ray diffraction technique. The experimental results show that the graphit ization of the thin film was initiated by heal treatment around 2100 d egrees C; the carbon layers of the thin film specimens heat-treated at 2 825 degrees C and above possessed good orientation, the phenomenon oi poly-phase graphitization appeared markedly, and the information of the mosaic structure of the sample was obtained; the interlayer spaci ng and the mosaic degree for 3 160 degrees C heat-treated thin film sa mples are 0.335 45 nm and 5.4 degrees, respectively. As far as the sou rce of two crystal phases with a slight difference in graphitization d egree is concerned, some inferences are discussed, which helps underst and more about the structure of the graphitization products.