DIELECTRIC-RELAXATION OF BA0.7SR0.3TIO3 THIN-FILMS FROM 1 MHZ TO 20 GHZ

The dielectric relaxation of Ba0.7Sr0.3TiO3 thin films was investigate d up to K band (20 GHz) using time domain and frequency domain measure ments. Our results show that from 1 mHz to 20 GHz, the dielectric rela xation of the complex capacitance of Ba0.7Sr0.3TiO3 thin films can be understood in terms of a power law dependence known as the Curie-von S chweidler law. The small dispersion (less than 7% decrease in capacita nce from 1 mHz to 20 GHz) and low loss (loss angle less than 0.006 at 20 GHz) measured in Ba0.7Sr0.3TiO3 thin films indicate that these film s are applicable to device application up to at least K band. (C) 1998 American Institute of Physics.