CCD BASED HIGH-RESOLUTION NONDESTRUCTIVE TESTING SYSTEM FOR INDUSTRIAL APPLICATIONS

Authors
NAGARKAR VV VASILE S GOTHOSKAR P GORDON JS GUPTA TK
Citation
Vv. Nagarkar et al., CCD BASED HIGH-RESOLUTION NONDESTRUCTIVE TESTING SYSTEM FOR INDUSTRIAL APPLICATIONS, Applied radiation and isotopes, 48(10-12), 1997, pp. 1459-1465
Citations number
17
Categorie Soggetti
Nuclear Sciences & Tecnology","Radiology,Nuclear Medicine & Medical Imaging","Chemistry Inorganic & Nuclear
Journal title
Applied radiation and isotopes
ISSN journal
09698043 → ACNP
Volume
48
Issue
10-12
Year of publication
1997
Pages
1459 - 1465
Database
ISI
SICI code
0969-8043(1997)48:10-12<1459:CBHNTS>2.0.ZU;2-K
Abstract
We have developed a large area structured CsI(Tl) imaging sensor for h igh resolution non-destructive evaluation using X-rays. The sensor is grown on a specially designed substrate. Our work has produced sensors which show up to a factor of 5 more light output per X-ray, the limit ing spatial resolution of 20 lp/mm, and several orders of magnitude fa ster speed of response compared to the existing sensors. With these ne w sensors, CCD detectors with millisecond data acquisition times;and h igh spatial resolution suitable for modern digital NDT will be possibl e. (C) 1997 Elsevier Science Ltd. All rights reserved.