SOURCE-TO-SAMPLE DISTANCE INDEPENDENT EFFICIENCY TECHNIQUE FOR XRF ANALYSIS

Authors
MAIA JM DOSSANTOS JMF CONDE CAN
Citation
Jm. Maia et al., SOURCE-TO-SAMPLE DISTANCE INDEPENDENT EFFICIENCY TECHNIQUE FOR XRF ANALYSIS, Applied radiation and isotopes, 48(10-12), 1997, pp. 1649-1656
Citations number
6
Categorie Soggetti
Nuclear Sciences & Tecnology","Radiology,Nuclear Medicine & Medical Imaging","Chemistry Inorganic & Nuclear
Journal title
Applied radiation and isotopes
ISSN journal
09698043 → ACNP
Volume
48
Issue
10-12
Year of publication
1997
Pages
1649 - 1656
Database
ISI
SICI code
0969-8043(1997)48:10-12<1649:SDIETF>2.0.ZU;2-R
Abstract
A technique to make the detection efficiency in XRF systems less depen dent on source-to-sample distance is presented. It is shown that this dependence can be made more constant within a large range of distances if a properly calculated annular mask is used. Experimental results ( for Ca, Ti, V and Zr), in good agreement with the calculated ones, are presented and show that constant efficiency values within +/- 5% can be obtained when the sample distance varies from 3 to 12 mm. However, peak absolute efficiencies are then reduced by a factor of about five. (C) 1997 Elsevier Science Ltd. All rights reserved.