M. Gester et al., HIGH-RESOLUTION X-RAY PHOTOELECTRON-SPECTROSCOPY ON GIANT MAGNETORESISTIVE COAG GRANULAR FILMS SANDWICHED BETWEEN PT LAYERS, Surface and interface analysis, 26(1), 1998, pp. 30-38
The chemical state of Co, Ag and Pt in giant magnetoresistive CoAg gra
nular films sandwiched between Pt layers is studied using high-resolut
ion x-ray photoelectron spectroscopy, Measurements were carried out as
a function of depth for samples deposited at different temperatures a
nd containing different amounts of Co, In all samples Ag is found to s
egregate at the surface to form an AgPt alloy, The depth profiles are
consistent with the deposited Co concentration modified by preferentia
l sputtering, No variation of the chemical state for Co or Ag in the C
oAg layer is found for different deposition conditions. However, small
amounts of Pt do affect the Co 3d electrons. (C) 1998 John Wiley & So
ns, Ltd.