HIGH-RESOLUTION X-RAY PHOTOELECTRON-SPECTROSCOPY ON GIANT MAGNETORESISTIVE COAG GRANULAR FILMS SANDWICHED BETWEEN PT LAYERS

Citation
M. Gester et al., HIGH-RESOLUTION X-RAY PHOTOELECTRON-SPECTROSCOPY ON GIANT MAGNETORESISTIVE COAG GRANULAR FILMS SANDWICHED BETWEEN PT LAYERS, Surface and interface analysis, 26(1), 1998, pp. 30-38
Citations number
26
Categorie Soggetti
Chemistry Physical
ISSN journal
01422421
Volume
26
Issue
1
Year of publication
1998
Pages
30 - 38
Database
ISI
SICI code
0142-2421(1998)26:1<30:HXPOGM>2.0.ZU;2-P
Abstract
The chemical state of Co, Ag and Pt in giant magnetoresistive CoAg gra nular films sandwiched between Pt layers is studied using high-resolut ion x-ray photoelectron spectroscopy, Measurements were carried out as a function of depth for samples deposited at different temperatures a nd containing different amounts of Co, In all samples Ag is found to s egregate at the surface to form an AgPt alloy, The depth profiles are consistent with the deposited Co concentration modified by preferentia l sputtering, No variation of the chemical state for Co or Ag in the C oAg layer is found for different deposition conditions. However, small amounts of Pt do affect the Co 3d electrons. (C) 1998 John Wiley & So ns, Ltd.