ANGLE-RESOLVED X-RAY PHOTOELECTRON-SPECTROSCOPY (ARXPS) STUDY OF SUBSTITUTION EFFECTS IN SB2TE3-XSEX CRYSTALS AND THEIR INFLUENCE ON DENSITY OF ANTISITE DEFECTS

Authors
BASTL Z SPIROVOVA I HORAK J
Citation
Z. Bastl et al., ANGLE-RESOLVED X-RAY PHOTOELECTRON-SPECTROSCOPY (ARXPS) STUDY OF SUBSTITUTION EFFECTS IN SB2TE3-XSEX CRYSTALS AND THEIR INFLUENCE ON DENSITY OF ANTISITE DEFECTS, Solid state ionics, 95(3-4), 1997, pp. 315-321
Citations number
24
Categorie Soggetti
Physics, Condensed Matter","Chemistry Physical
Journal title
Solid state ionics → ACNP
ISSN journal
01672738
Volume
95
Issue
3-4
Year of publication
1997
Pages
315 - 321
Database
ISI
SICI code
0167-2738(1997)95:3-4<315:AXP(SO>2.0.ZU;2-2
Abstract
An angle-resolved X-ray photoelectron spectroscopy (ARXPS) method is f irst introduced for elucidation of the mechanism of Te substitution by Se in Sb2Te3 crystals, The obtained results are consistent with the s ubstitution of the selenium atoms predominantly into the Te-2 atomic l ayers. The observed substitution makes it possible to evaluate the int eractions of incorporated Se atoms with antisite defects, Sb-Te'. The incorporation of Se atoms into the lattice increases ionicity of cryst al bonds and suppresses the Sb-Te' defect concentration, which is acco mpanied by a decrease in hole concentration.