MEASUREMENT OF ATOMIC FRACTIONS IN MULTI-PHASED MATERIALS OF LIMITED MASS VIA AN EMPIRICAL-APPROACH TO EXAFS MODELING (VOL 7, PG 1153, 1997)

Authors
HARRIS VG OLIVER SA AYERS JD DAS BN
Citation
Vg. Harris et al., MEASUREMENT OF ATOMIC FRACTIONS IN MULTI-PHASED MATERIALS OF LIMITED MASS VIA AN EMPIRICAL-APPROACH TO EXAFS MODELING (VOL 7, PG 1153, 1997), Journal de physique. III, 7(12), 1997, pp. 2475-2478
Citations number
9
Journal title
Journal de physique. III → ACNP
ISSN journal
11554320
Volume
7
Issue
12
Year of publication
1997
Pages
2475 - 2478
Database
ISI
SICI code
1155-4320(1997)7:12<2475:MOAFIM>2.0.ZU;2-U
Abstract
A least-square fitting analysis of EXAFS data collected from partially -crystallized Fe80B20 thin films (t = 15 nm), using data collected fro m pure phase standards of the crystallization products, was found effe ctive in determining the relative atomic fraction of each crystalline phase present. This fitting scheme provides a means for the quantitati ve treatment of crystalllization and precipitation kinetics in thin fi lms and multilayered structures.