VISIBLE-BLIND GAN SCHOTTKY-BARRIER DETECTORS GROWN ON SI(111)

Citation
A. Osinsky et al., VISIBLE-BLIND GAN SCHOTTKY-BARRIER DETECTORS GROWN ON SI(111), Applied physics letters, 72(5), 1998, pp. 551-553
Citations number
11
Categorie Soggetti
Physics, Applied
Journal title
ISSN journal
00036951
Volume
72
Issue
5
Year of publication
1998
Pages
551 - 553
Database
ISI
SICI code
0003-6951(1998)72:5<551:VGSDGO>2.0.ZU;2-2
Abstract
We report novel GaN detectors grown by molecular beam epitaxy on Si(11 1) substrates. Wurtzite structure epitaxial GaN exhibits room-temperat ure photoluminescence with a band-edge-related emission width as narro w as 7 nm and intensities comparable to high quality layers grown on s apphire by metalorganic chemical vapor deposition. Spectral response o f lateral geometry Schottky detectors shows a sharp cutoff at 365 nm w ith peak responsivities of approximate-to 0.05 A/W at 0V, and approxim ate-to 0.1 A/W with a -4V bias. The dark current is approximate-to 60 nA at -2V bias. the noise equivalent power is estimated to be 3.7x10(- 9)W over the responsible bandwidth of 2.2 MHz.