NONEQUILIBRIUM TRANSPORT IN ANDERSON INSULATIONS

We report observations of glass behavior of an electronic system in an Anderson insulator. The system used is a MOSFET-like structure with a thin film of In2O3-x serving as the active element. The glassy behavi or is reflected as a local minimum at the 'cool-down' gate voltage in the conductance vs. gate-voltage, G(V-g) sweeps. Relaxation is monitor ed as a function of temperature and film disorder. Studying certain fe atures of the G(V-g) minima reveals that interactions are important in the relaxation process.